Detection Model for Defect Signal Spectrograms Based on Ultra-ViT

Detection Model for Defect Signal Spectrograms Based on Ultra-ViT

TANG Dong-lin, LI Heng-hui, DING Chao, ZHAO Yun-liang

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Manufacturing Automation ›› 2025, Vol. 47 ›› Issue (3) : 134-141. DOI: 10.3969/j.issn.1009-0134.2025.03.017

Detection Model for Defect Signal Spectrograms Based on Ultra-ViT

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}. 2025, 47(3): 134-141. https://doi.org/10.3969/j.issn.1009-0134.2025.03.017

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